ISO/DIS 16666

Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation. The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

71.040.40

Statut:

Brouillon

Date de Publication:

1969-12-30

Numéro Standard:

ISO/DIS 16666