ISO/DIS 11505

Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

71.040.40

Statut:

Brouillon

Date de Publication:

1969-12-30

Numéro Standard:

ISO/DIS 11505