ISO 17297:2025

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

01.040.71; 71.040.50

Statut:

Publié

Date de Publication:

2025-05-25

Numéro Standard:

ISO 17297:2025