ISO 14975:2000

Surface chemical analysis — Information formats

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

35.240.70; 71.040.40

Statut:

Publié

Date de Publication:

2000-12-06

Numéro Standard:

ISO 14975:2000