IEC 62047-50:2025

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones. This document applies to MEMS capacitive microphones.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.99

Statut:

Publié

Date de Publication:

2025-04-28

Numéro Standard:

IEC 62047-50:2025