IEC 62899-202-11:2025

Printed electronics - Part 202-11: Materials - Conductive ink - Measurement method of electrical resistance uniformity for large area printed conductive layer

IEC 62899-202-11:2025 specifies a measurement method of electrical resistance uniformity for large area printed conductive layers. The purpose of this method is to measure resistance uniformity of planar large area printed layers. This method cannot measure sheet resistance. The methods measure electrical resistance or electrical potential drop and use direct contact.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.180; 87.080

Statut:

Publié

Date de Publication:

2025-04-22

Numéro Standard:

IEC 62899-202-11:2025