IEC TR 61760-5-1:2024
IEC TR 61760-5-1:2024 describes examples of methods using electrical strain gauges for determination of critical mechanical stresses in assembly processes. These stresses can damage chip type ceramic components, causing so called “bending cracks”. Area-array components are excluded from the scope of this document.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
31.190
Statut:
Publié
Date de Publication:
2024-01-30
Numéro Standard:
IEC TR 61760-5-1:2024