IEC 62899-503-1:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

29.045; 31.080.30

Statut:

Publié

Date de Publication:

2020-05-26

Numéro Standard:

IEC 62899-503-1:2020