IEC CENT-CHAL:2006
"International Standardization as a Strategic Tool", comprising the commended papers from the IEC Centenary Challenge. The IEC Centenary Challenge was a competition for papers on the economic, business and social impact of International Standards on business. It was organized in association with The Economist magazine and in partnership with three leading professional engineering bodies: the IET (Institute of Engineering and Technology); IEEE (Institute of Electrical and Electronics Engineers); and VDE, the German association for electrical, electronic and information technologies. The commended papers (in alphabetical order) included are: "Architecture-based approaches to international standardization and evolution of business models" by Junjiro Shintaku, lead author; Koichi Ogawa, Tetsuo Yoshimoto, co-authors, The University of Tokyo - Manufacturing Management Research Center, Japan; "Benefits of standardization in the microelectronics industries and their implications on nanotechnology and other innovative industries" by Werner Bergholz, lead author; Bettina Weiss, Carlos Lee, co-authors, International University Bremen, Germany; "Do national standards hinder or promote trade in electrical products?" by Johannes Moenius, University of Redlands, USA; "Industrial legislatures: The American system of standardization" by Andrew Russell, The Johns Hopkins University, USA; "Measuring the performance of standard setting organizations"by Timothy S. Simcoe, lead author; Marc Rysman, co-author, The Joseph L. Rotman School of Management - University of Toronto, Canada; "Standardization and business development: The global impact of the IOSA standards and the value of anticipation" by David Hodgkinson, The University of Western Australia, Australia; "Standardization and patent pools: Using patent licensing to lead the market" by Hajime Yamada, Toyo University, Japan; "Standardizing mesopic vision conditions and incidence on light sources science and technology" by Georges Zissis, lead author, Stuart Mucklejohn, co-author, Université Paul Sabatier - Toulouse III, France, Laboratoire des Plasmas et de Conversion de l'Energie - Team "Sources Intenses des Photons"; "Standards for business - How companies benefit from participation in international standards setting" by Dr.ir. Henk J. de Vries, RSM Erasmus University, The Netherlands; "The entrepreneur and standards"by Ken Krechmer, lead author; Elaine Baskin, co-author; University of Colorado at Boulder, USA; "The impacts of ICT standards: Three views" by Knut Blind, Fraunhofer ISI, Technische Universität Berlin, Germany.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
N/A
Statut:
Annulée
Date de Publication:
2006-12-14
Numéro Standard:
IEC CENT-CHAL:2006