IEC 61010-031:2015+AMD1:2018 CSV

Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement
IEC 61010-031:2015+A1:2018 specifies safety requirements for hand-held and hand-manipulated probe assemblies of the types described below, and their related accessories. These probe assemblies are for direct electrical connection between a part and electrical test and measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment. It has the status of a group safety publication in accordance with IEC GUIDE 104. IEC 61010-031 is a stand-alone standard. This second edition cancels and replaces the first edition published in 2002 and Amendment 1:2008. This edition constitutes a technical revision. This edition includes the following significant changes from the first edition, as well as numerous other changes:<br /> a) Voltages above the levels of 30 V r.m.s., 42,4 V peak, or 60 V d.c. are deemed to be HAZARDOUS LIVE instead of 33 V r.m.s., 46,7 V peak, or 70 V d.c.<br /> b) Servicing is now included within the scope.<br /> c) Extended environmental conditions are included within the scope.<br /> d) New terms have been defined.<br /> e) Tests for REASONABLY FORESEEABLE MISUSE have been added, in particular for fuses.<br /> f) Additional instruction requirements for probe assembly operation have been specified.<br /> g) Limit values for ACCESSIBLE parts and for measurement of voltage and touch current have been modified.<br /> h) SPACINGS requirements for mating of CONNECTORS have been modified.<br /> i) PROBE TIPS and SPRING-LOADED CLIPS requirements have been modified. The PROTECTIVE FINGERGUARD replace the BARRIER with new requirements.<br /> j) Insulation requirements (6.5) and test procedures (6.6.5) have been rewritten and aligned when relevant with Part 1. Specific requirements have been added for solid insulation and thin-film insulation.<br /> k) The terminology for MEASUREMENT CATEGORY I has been replaced with the designation "not RATED for measurements within MEASUREMENT CATEGORIES II, III, or IV".<br /> l) The flexing/pull test (6.7.4.3) has been partially rewritten.<br /> m) Surface temperature limits (Clause 10) have been modified to conform to the limits of IEC Guide 117.<br /> n) Requirements for resistance of PROBE WIRES to mechanical stresses have been added in Clause 12 and a new Annex D.<br /> o) Requirements have been added regarding the prevention of HAZARD from arc flash and short-circuits for SPRING-LOADED CLIPS.<br /> p) A new informative Annex E defines the dimension of the 4 mm banana CONNECTORS. <strong>This consolidated version consists of the second edition (2015) and its amendment 1 (2018). Therefore, no need to order amendment in addition to this publication.</strong>
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
19.080
Statut:
Publié
Date de Publication:
2018-05-28
Numéro Standard:
IEC 61010-031:2015+AMD1:2018 CSV