IEC PAS 62162:2000

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Remplacé

Date de Publication:

2000-08-21

Numéro Standard:

IEC PAS 62162:2000