IEC 62220-1:2003
Specifies the method for the determination of the detective quantum efficiency (DQE) of digital X-ray imaging devices as a function of exposure and of spatial frequency for the working conditions in the range of the medical application as specified by the manufacturer.
Is applicable to projection digital X-ray imaging devices producing images in digital format that are used for medical diagnosis. It is restricted to digital X-ray imaging devices that are used for radiographic imaging, such as CR systems, selenium-based systems, flat panel detectors, optically coupled CCD detectors, and digital X-ray image intensifiers used for single exposures.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
11.040.50
Statut:
Remplacé
Date de Publication:
2003-10-22
Numéro Standard:
IEC 62220-1:2003