IEC 60747-10:1991
It is a generic specification for semiconductor devices, discrete
devices and integrated circuits, including multichip integrated
circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in
the IECQ System and gives general rules for measuring methods of
electrical characteristics, climatic and mechanical tests, and
endurance tests.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
31.080.01;
31.200
Statut:
Annulée
Date de Publication:
1991-05-20
Numéro Standard:
IEC 60747-10:1991