Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD...
IEC 60749-28:2022 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices,…
Information security — Cryptographic techniques based on elliptic curves — Part 5: Elliptic curve ge...
The ISO/IEC 15946 series specifies public-key cryptographic techniques based on elliptic curves described in ISO/IEC 15946-1.
This document defines elliptic curve generation techniques useful for implementing the elliptic curve based mechanisms defined in ISO/IEC 29192‑4, ISO/IEC 9796‑3, ISO/IEC 11770‑3, ISO/IEC 14888‑3, ISO/IEC 18033‑2 and ISO/IEC 18033‑5.
This document is applicable to…
Implants for surgery — Active implantable medical devices — Part 4: Implantable infusion pump system...
This document specifies particular requirements for active implantable medical devices intended to deliver a medicinal substance to site-specific locations within the human body, to provide basic assurance of safety for both patients and users. It amends and supplements ISO 14708-1:2014. The requirements of this document take priority over those of ISO 14708-1.
This document is applicable to…
Health informatics — Clinical information models — Characteristics, structures and requirements
This document:
— Specifies clinical information models (CIMs) as health and care concepts that can be used to define and to structure information for various purposes in health care, also enabling information reuse;
— Describes requirements for CIMs content, structure and context and specification of their data elements, data element relationships, meta-data and versioning, and provides…
This document establishes and defines terms used in technical product documentation relating to technical drawings, product definition and related documentation in all fields of application.
The terms have been classified into specific fields of application.
NOTE New terms required by ISO/TC 10 subcommittees and working groups for new or revised standards will be ratified by the ISO/TC 10…
Information security - Cryptographic techniques based on elliptic curves - Part 5: Elliptic curve ge...
The ISO/IEC 15946 series specifies public-key cryptographic techniques based on elliptic curves described in ISO/IEC 15946-1.
This document defines elliptic curve generation techniques useful for implementing the elliptic curve based mechanisms defined in ISO/IEC 29192‑4, ISO/IEC 9796‑3, ISO/IEC 11770‑3, ISO/IEC 14888‑3, ISO/IEC 18033‑2 and ISO/IEC 18033‑5.
This document is applicable to…
Batteries for Use in Stationary and Motive Auxiliary Power Applications
1.1 These requirements cover battery systems as defined by this standard for use as energy storage for
stationary applications such as for PV, wind turbine storage or for UPS, etc. applications. These systems
shall be installed in accordance with NFPA 70, C22.1, or other applicable installation codes.
1.2 These requirements also cover battery systems as defined by this standard for use in…
Water quality — Sampling — Part 25: Guideline on the validation of the storage time of water samples
The purpose of this document is to describe test plans and different operating methodologies of these test plans to define and verify the acceptable length of stability of a substance in a sample under specified conditions of preservation (temperature, matrix, light, addition of a stabilizer, where appropriate, type of preservation etc.) before starting analytical protocols (chemicals and physico…
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
IEC 62228-7:2022 specifies test and measurement methods for the EMC evaluation of CXPI transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. This specification is applicable for standard CXPI transceiver ICs and ICs with embedded CXPI transceiver and covers
the emission of RF…
