ISO/FDIS 20171

Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electron microscopy(TIFF/SEM)

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

35.240.70; 37.020

Statut:

Annulée

Date de Publication:

1969-12-30

Numéro Standard:

ISO/FDIS 20171