ISO 23833:2013

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
OEN:
ISO
Langue:
English
Code(s) de l'ICS:
01.040.71; 71.040.99
Statut:
Publié
Date de Publication:
2013-04-04
Numéro Standard:
ISO 23833:2013