ISO 15625:2014

Silk — Electronic test method for defects and evenness of raw silk

ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers. It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

59.080.01

Statut:

Publié

Date de Publication:

2014-04-28

Numéro Standard:

ISO 15625:2014