ISO 11952:2014

Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems

ISO 11952:2014 specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

71.040.40

Statut:

Annulée

Date de Publication:

2014-05-11

Numéro Standard:

ISO 11952:2014