ISO 18116:2005

Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis

ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.

OEN:

ISO

Langue:

English

Code(s) de l'ICS:

71.040.40

Statut:

Annulée

Date de Publication:

2005-08-21

Numéro Standard:

ISO 18116:2005