ISO 11562:1996
Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.
OEN:
ISO
Langue:
English
Code(s) de l'ICS:
17.040.20
Statut:
Annulée
Date de Publication:
1996-12-04
Numéro Standard:
ISO 11562:1996