IEC TS 62607-6-11:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic • defect density nD of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by • Raman spectroscopy

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

07.120

Statut:

Publié

Date de Publication:

2022-02-07

Numéro Standard:

IEC TS 62607-6-11:2022