IEC 62951-6:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.99

Statut:

Publié

Date de Publication:

2019-05-05

Numéro Standard:

IEC 62951-6:2019