IEC TS 62876-2-1:2018

Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
27.160; 07.120
Statut:
Publié
Date de Publication:
2018-08-28
Numéro Standard:
IEC TS 62876-2-1:2018