IEC PAS 62165:2000

Guidelines for the measurement of thermal resistance of GaAs FETs

For power GaAs FET applications requiring high reliability an accurate measurement of thermal resistance is extremely important to provide the user with knowledge of the FET's operating temperature so that more accurate life estimates can be made. FET failure mechanism and failure rates have in general, an exponential dependence on temperature.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Annulée

Date de Publication:

2000-08-21

Numéro Standard:

IEC PAS 62165:2000