IEC 61788-1:1998
Covers a test method for the determination of the d.c. critical current of Cu/Nb-Ti composite superconductors that have a copper/superconductor ratio larger than 1. This method is intended for use with superconductors that have critical currents less than 1000 A and n-values larger than 12, under standard test conditions and at magnetic fields less than or equal to 0,7 of the upper critical magnetic field.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
17.220.20;
29.050
Statut:
Révisé
Date de Publication:
1998-02-18
Numéro Standard:
IEC 61788-1:1998