IEC 60147-2:1963

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.10

Statut:

Annulée

Date de Publication:

1962-12-31

Numéro Standard:

IEC 60147-2:1963