IEC 60147-2C:1970

Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high- frequency parameters.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.10

Statut:

Annulée

Date de Publication:

Numéro Standard:

IEC 60147-2C:1970