IEC 60147-0:1966

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology

Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.10

Statut:

Annulée

Date de Publication:

1965-12-31

Numéro Standard:

IEC 60147-0:1966