IEC TR 63133:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Publié

Date de Publication:

2017-10-10

Numéro Standard:

IEC TR 63133:2017