IEC 62884-2:2017

IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.<br /> In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.<br /> NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.