IEC 62047-18:2013
IEC 62047-18:2013 specifies the method for bend testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 micrometre and 10 micrometre. This International Standard specifies the bend testing and test piece shape for micro-sized smooth cantilever type test pieces, which enables a guarantee of accuracy corresponding to the special features.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
31.080.99
Statut:
Publié
Date de Publication:
2013-07-16
Numéro Standard:
IEC 62047-18:2013