IEC 60749-30:2005/AMD1:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Révisé

Date de Publication:

2011-05-24

Numéro Standard:

IEC 60749-30:2005/AMD1:2011