IEC 61967-4:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements. The contents of the corrigendum 1 of June 2017 have been included in this copy.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.200

Statut:

Révisé

Date de Publication:

2002-04-29

Numéro Standard:

IEC 61967-4:2002