IEC 61726:1999
Describes the measurement of screening attenuation by the reverberation, or stirred, chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring sreening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
33.120.10;
33.120.30
Statut:
Révisé
Date de Publication:
1999-11-29
Numéro Standard:
IEC 61726:1999