IEC 61580:1995

Measurement of return loss on waveguide and waveguide assemblies

Describes the sweep frequency method used for the measurement of return loss on waveguide and waveguide assemblies. The contents of the corrigendum of July 2006 have been included in this copy.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

33.120.10

Statut:

Publié

Date de Publication:

1995-11-21

Numéro Standard:

IEC 61580:1995