IEC 61000-4-17:1999+AMD1:2001 CSV
Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines - test voltage waveform; - range of test levels; - test generator; - test set-up; - test procedure. This consolidated version consists of the first edition (1999) and its amendment 1 (2001). Therefore, no need to order amendment in addition to this publication.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
33.100.20
Statut:
Publié
Date de Publication:
2002-07-07
Numéro Standard:
IEC 61000-4-17:1999+AMD1:2001 CSV