IEC 60749-31:2002
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
The contents of the corrigendum of August 2003 have been included in this copy.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
31.080.01
Statut:
Publié
Date de Publication:
2002-08-29
Numéro Standard:
IEC 60749-31:2002