IEC 60749-13:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Révisé

Date de Publication:

2002-04-11

Numéro Standard:

IEC 60749-13:2002