IEC 60749-12:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Révisé

Date de Publication:

2002-04-29

Numéro Standard:

IEC 60749-12:2002