IEC 60749-6:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Révisé

Date de Publication:

2002-04-11

Numéro Standard:

IEC 60749-6:2002