IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.080.01

Statut:

Publié

Date de Publication:

2002-08-29

Numéro Standard:

IEC 60749-1:2002