IEC 60444-2:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

OEN:

IEC

Langue:

English

Code(s) de l'ICS:

31.140

Statut:

Publié

Date de Publication:

1979-12-31

Numéro Standard:

IEC 60444-2:1980