IEC 60333:1993

Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
OEN:
IEC
Langue:
English
Code(s) de l'ICS:
17.240
Statut:
Annulée
Date de Publication:
1993-07-13
Numéro Standard:
IEC 60333:1993