Information technology — Financial information exchange — Simple binary encoding
This document provides the normative specification of Simple Binary Encoding (SBE), which is one of the possible syntaxes for FIX messages, but not limited to FIX messages. The scope comprises the encoding (wire format) and the message schema for SBE.
Information technology - SoftWare Hash IDentifier (SWHID) Specification V1.2
This specification defines a standard data format for referencing software artifacts that match the data model of modern distributed version control systems.
This format includes the typical tree-like structure of a filesystem hierarchy, but also, special nodes to track revisions and releases, as well as the full status of a version control system, with all its development branches.
A key…
Information technology - Financial information exchange - Simple binary encoding
This document provides the normative specification of Simple Binary Encoding (SBE), which is one of the possible syntaxes for FIX messages, but not limited to FIX messages. The scope comprises the encoding (wire format) and the message schema for SBE.
Electrical relays - Tests and measurements - Part 24: Load transfer
IEC 63522-24:2025 This part of IEC 63522 is used for testing along with the appropriate severities and conditions for measurements and tests designed to assess the ability of DUTs to perform under expected conditions of transportation, storage and all aspects of operational use.
This document defines a test to check that a multipole relay is capable of transferring one source to another.
Relais électriques - Essais et mesurages - Partie 24: Transfert de charge
IEC 63522-24:2025 La présente partie de l'IEC 63522 traite des essais ainsi que des sévérités et conditions appropriées pour les mesurages et essais destinés à évaluer l'aptitude de DUT à fonctionner dans des conditions prévues de transport, de stockage, et de tous les aspects d'utilisation opérationnelle.
Le présent document défini un essai qui permet de vérifier qu'un…
Printed electronics - Part 202-11: Materials - Conductive ink - Measurement method of electrical res...
IEC 62899-202-11:2025 specifies a measurement method of electrical resistance uniformity for large area printed conductive layers. The purpose of this method is to measure resistance uniformity of planar large area printed layers. This method cannot measure sheet resistance. The methods measure electrical resistance or electrical potential drop and use direct contact.
Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication te...
IEC 62047-46:2025 specifies the requirements and testing method to measure the tensile strength of membrane with nanoscale thickness (length from 100 μm to 5 000 μm, width from 100 μm to 1 000 μm, thickness from 50 nm to 500 nm) which is fabricated by micromachining technology used in silicon-based micro-electromechanical system (MEMS).
This document is applicable to in-situ tensile strength…
Electrical relays - Tests and measurements - Part 56: Ball Pressure test
IEC 63522-56:2025 This part of IEC 63522 is used for testing along with the appropriate severities and conditions for measurements and tests designed to assess the ability of specimens to perform under expected conditions of transportation, storage and all aspects of operational use.
The object of this test is to define a standard test method for evaluation of appropriate materials to withstand…
Relais électriques - Essais et mesurages - Part 56: Essai à la bille
IEC 73522-56:2025 La présente partie de l'IEC 63522 est utilisée pour les essais mettant en œuvre les sévérités et les conditions appropriées pour les mesurages et les essais, destinés à évaluer la capacité des éprouvettes à fonctionner dans des conditions prévues de transport et de stockage, ainsi que tous les aspects de l'utilisation opérationnelle. L'objet de cet essai est de…
