This document specifies the characteristics of laminate floor coverings, supplied in modular format e.g. tiles, planks. It also specifies requirements for marking and packaging.
Additional operational properties are given in Annex A.
Performance rating of positive displacement refrigerant compressor
This document specifies normative references, terms and definitions, rating requirements, published rating, tolerance and marking provisions of positive displacement refrigerant compressors. This document applies to positive displacement refrigerant compressors and their performance in air-conditioning, heating, refrigeration and dehumidification applications. Single stage, two-stage and…
Ships and marine technology — Hopper dredger — Suction tube position monitor
This document specifies the components, interface, technical requirements and test methods of the suction tube position monitor (STPM).
It is applicable only to the installed components, functions or systems. This document covers the design, manufacture and modifications of the suction tube position monitor.
Passive RF and microwave devices, intermodulation level measurement - Part 3: Measurement of passive...
IEC 62037-3:2025 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 62037-3:2025 defines the impact test on coaxial connectors to evaluate their robustness against weak connections…
Passive RF and microwave devices, intermodulation level measurement - Part 3: Measurement of passive...
IEC 62037-3:2025 defines the impact test on coaxial connectors to evaluate their robustness against weak connections and particles inside the connector, as independently as possible from the effects of cable passive intermodulation (PIM). For other connectors (e.g. panel mounted connectors), the cable can be replaced by an adequate transmission line (e.g. airline, stripline). In order to evaluate…
Dispositifs RF et à micro-ondes passifs, mesure du niveau d'intermodulation - Partie 3: Mesure ...
L’IEC 62037-3:2025 définit l’essai de choc réalisé sur des connecteurs coaxiaux pour évaluer leur robustesse dans le cas de connexions faibles et de particules à l’intérieur des connecteurs, aussi indépendamment que possible des effets de l’intermodulation passive (PIM) des câbles. Pour les autres connecteurs (par exemple les connecteurs montés sur panneaux), le câble peut être remplacé par une…
Passive RF and microwave devices, intermodulation level measurement - Part 8: Measurement of passive...
IEC 62037-8:2025 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 62037-8:2025 defines a radiated passive intermodulation (PIM) test to determine PIM levels generated by a device…
Passive RF and microwave devices, intermodulation level measurement - Part 8: Measurement of passive...
IEC 62037-8:2025 defines a radiated passive intermodulation (PIM) test to determine PIM levels generated by a device or object when it is exposed to RF radiation. This test can be conducted on any material or object and is not limited to devices designed to propagate RF signals. This test can be conducted as either a near field or far field test as defined by the test specification in an outdoor…
Dispositifs RF et à micro-ondes passifs, mesure du niveau d’intermodulation - Partie 8: Mesure de l’...
L’IEC 62037-8:2025 définit un essai d’intermodulation passive (PIM) rayonnée destiné à déterminer les niveaux d’intermodulation passive générés par un dispositif ou un objet lorsqu’il est exposé à un rayonnement RF. Cet essai peut être effectué sur tout matériau ou objet et n’est pas limité aux dispositifs conçus pour propager des signaux RF. Cet essai peut être effectué en champ proche ou en…
Semiconductor devices - Micro-electromechanical devices - Part 45: Silicon based MEMS fabrication te...
IEC 62047-45:2025 specifies the requirements and testing method to measure the impact resistance of nanostructures which are fabricated by micromachining technology used in silicon-based micro-electromechanical system (MEMS).
This document is applicable to the in-situ impact resistance measurement of nanostructures manufactured by microelectronic technology process and other micromachining…