Industrial-process measurement and control - Data structures and elements in process equipment catal...
IEC 61987-31:2022 provides
a characterization for the integration of infrastructure devices in the Common Data Dictionary (CDD);
generic structures in conformance with IEC 61987-10 for Operating Lists of Properties (OLOPs) and Device Lists of Properties (DLOPs) of infrastructure devices.
The generic structures for the OLOP and DLOP contain the most important blocks for infrastructure devices.…
Mesure et commande des processus industriels - Structures de données et éléments dans les catalogues...
L’IEC 61987-31:2022 fournit:
une caractérisation pour l’intégration des appareils d’infrastructure dans le Dictionnaire de données communes (CDD);
des structures génériques conformes à l’IEC 61987-10 pour les listes de propriétés fonctionnelles (OLOP) et les listes des propriétés d’appareils (DLOP) d’infrastructure.
Les structures génériques pour l’OLOP et la DLOP contiennent les blocs les…
Spatial wireless power transfer based on multiple magnetic resonances - Part 2: Reference model
IEC 63245-2:2022 specifies a reference model for spatial wireless power transfer based on multiple magnetic resonances (SWPT-MMR), which is a type of non-radiative wireless power transfer (WPT). The document contains an overview of SWPT-MMR and a reference model.
Transfert d’énergie sans fil dans l’espace reposant sur des résonances magnétiques multiples - Parti...
L'IEC 63245-2:2022 spécifie un modèle de référence pour le transfert d’énergie sans fil dans l’espace reposant sur des résonances magnétiques multiples (SWPT-MMR), qui est un type de transfert d’énergie sans fil (WPT) non radiatif. Le présent document donne une vue d’ensemble d’un SWPT-MMR et fournit un modèle de référence.
Configurable car infotainment services (CCIS) - Part 4: Protocol
IEC TR 63246-4:2022 describes the CCIS protocol, which includes the protocol messages, parameters and procedures performed by protocol entities. This part is informative; its intent is to provide information that can be considered in order to implement the CCIS protocol.
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variatio...
IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard…
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1: Méthode d...
L’IEC 63364-1:2022 spécifie les termes, la méthode d’essai et le rapport du système de détection de variation acoustique basé sur l’IDO. Elle fournit la méthode d’évaluation pour chaque partie du système de détection de variation acoustique basé sur l’IDO dans le schéma de principe, les paramètres de caractérisation, les symboles, les montages d’essai et les conditions. En outre, le présent…
Nanomanufacturing - Key control characteristics - Part 6-18: Graphene-based material - Functional gr...
IEC TS 62607-6-18:2022(E) establishes a standardized method to determine the chemical key control characteristic
functional groups
for functionalized graphene-based material and graphene oxide by
thermogravimetry analysis (TGA) coupled with Fourier transform infrared spectroscopy (FTIR), referred to as TGA-FTIR.
The content of functional groups is derived by changes in mass of the…
Display lighting unit - Part 1-5: Electrical signal interface of LED BLU
IEC TR 62595-1-5:2022(E), which is a Technical Report, provides information for the future standardization of the electrical signal interface of LED backlight units for liquid crystal display television sets, which include control signals, control data and LED driver interface. This document only provides information about 2-D local dimming LED backlight units, with or without local boosting.…
Nanomanufacturing - Key control characteristics - Part 6-5: Graphene-based materials - Contact and s...
IEC TS 62607-6-5:2022(E) establishes a standardized method to determine the key control characteristics
contact resistance, and
sheet resistance
for graphene-based materials and other two-dimensional materials by a
transmission line measurement.
The method uses test structures applied to the 2D material by photolithographic methods consisting of several metal electrodes with…