Industrial automation systems — Numerical control of machines — NC processor output — File structure...
This International Standard defines a file structure format
and a language format for the representation of CLDATA
on physical media.
The CLDATA reference language (RL) is used for the
machining of parts. It provides for the control of technological
functions and movement at the numerical control machine.
Each processor using one of the numerical control programming
languages shall be capable of…
Industrial automation systems and integration — Product data representation and exchange — Part 513:...
This part of ISO 10303 specifies the interpretation of the generic resources for the definition of an elementary
boundary representation model.
The following are within the scope of this part of ISO 10303:
— the definition of an elementary_brep_shape_representation, this is a representation composed
of one or more manifold_solid_breps each of which is defined with elementary geometry and
complete…
Live Working - Voltage Detectors - Part 3: Two-Pole Low-Voltage Type
1 SCOPE
This part of IEC 61243 is applicable to two-pole voltage detectors to be used
on electrical systems for nominal voltages not exceeding 1 000 V a.c. and/or 1
500 V d.c. and below 500 Hz (nominal frequencies). The detector types are
classified as follows: voltage class A: up to and including 500 V a.c./750 v
d.c.; voltage class B: up to and including 1 000 V a.c./1 500 V d.c.…
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, ...
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.
Applies to monolithic microwave GaAs integrated circuits (MMICSs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors and capacitors.
Aims at estimating the expected lifetime of the devices at operational temperatures; usually the median lifetime (50 % failure) is used for this purpose.
The purpose is to define a standard approach for evaluating…
