Soil quality — Determination of particle size distribution in mineral soil material — Method by siev...
This document specifies a basic method of determining the particle size distribution applicable to a wide range of mineral soil materials, including the mineral fraction of organic soils. It also offers procedures to deal with the less common soils mentioned in the introduction. This document has been developed largely for use in the field of environmental science, and its use in geotechnical…
Determination of the resistance to gas explosions of passive fire protection materials — Part 3: Tub...
ISO 23693 part 1 aims to simulate the mechanical loads that could be imparted to passive fire protection (PFP) materials and systems by explosions resulting from releases of flammable gas, pressurised liquefied gas, flashing liquid fuels, or dust that may precede a fire. Explosions can give rise to pressure and drag forces and damage to PFP materials in a gas explosion can be caused by the direct…
Railway Infrastructure — Ballastless track — Part 1: General Requirements
This ISO standard specifies the general requirements relating to the design of ballastless track
systems, including classification of ballastless track, system, subsystems and components
requirements, and other related interfaces.
Optique et photonique — Lasers et équipements associés aux lasers — Méthode d'essai du facteur ...
Le présent document spécifie les modes opératoires et les techniques utilisés pour obtenir des valeurs comparables du facteur d'absorption des composants optiques pour lasers.
Electronic fee collection — Guidelines for security protection profiles
ISO/TS 17574:2017 provides guidelines for preparation and evaluation of security requirements specifications, referred to as Protection Profiles (PP) in ISO/IEC 15408 (all parts) and in ISO/IEC TR 15446.
By Protection Profile (PP), it means a set of security requirements for a category of products or systems that meet specific needs. A typical example would be a PP for On-Board Equipment (OBE) to…
Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolutio...
This document defines the procedure for determining the point resolution, called Scherzer resolution, of high-resolution transmission electron microscopes (HREM), which have the ability to visualize the sample structure with sub-nanometer fineness. The measurement of real spherical aberration coefficient of the objective lens is also included in the measurement procedure.
This document does not…
