Industrial automation systems and integration — Product data representation and exchange — Part 15: ...
This document specifies the transformation of SysML (ISO/IEC 19514:2017) constructs to XSD (World Wide Web Consortium's XML schema definition language) constructs for the purpose of representing the SysML model represented in XMI (ISO/IEC 19509:2014) as XML (World Wide Web Consortium's XML) schemas. The specified mapping is a one-way transformation from SysML information model…
ISO general purpose metric screw threads — Tolerances — Part 4: Limits of sizes for hot-dip galvaniz...
This document specifies limit deviations and limits of sizes for the pitch and crest diameters of the hot-dip galvanized metric external screw threads conforming to the coarse thread series of ISO 262 (from M8 to M64) having a basic profile according to ISO 68-1.
This document is applicable to the hot-dip galvanized metric external screw threads to mate with the internal screw threads tapped with…
Filetages métriques ISO pour usages généraux — Tolérances — Partie 4: Dimensions limites pour fileta...
Le présent document spécifie les écarts et les dimensions limites des diamètres sur flancs et au sommet des filetages extérieurs métriques galvanisés à chaud, se conformant à la série grossière de l'ISO 262 (de M8 à M64), de profil de base conforme à l'ISO 68‑1.
Le présent document s'applique aux filetages extérieurs métriques galvanisés à chaud pour assemblages avec des filetages…
Industrial automation systems and integration — Product data representation and exchange — Part 16: ...
This document specifies a mapping of SysML (ISO/IEC 19514:2017) constructs to EXPRESS (ISO 10303-11:2004) elements for the purpose of representing SysML model represented in XMI (ISO/IEC 19509:2014) as EXPRESS (ISO 10303-11:2004) schemas. The specified mapping is a one-way transformation from SysML information model represented in XMI into an EXPRESS schema.
NOTE Due to this limitation…
Nanotechnologies — Détermination de la distribution de taille et de forme des particules par microsc...
Le présent document spécifie des méthodes permettant de déterminer les distributions de taille et de forme des nanoparticules, par l’acquisition et l’évaluation d’images obtenues avec un microscope électronique à balayage, puis l’obtention de résultats exacts et la rédaction de rapports.
NOTE 1 Le présent document s’applique aux particules dont la limite de taille inférieure dépend de l’…
Nanotechnologies — Measurements of particle size and shape distributions by scanning electron micros...
This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.
NOTE 1 This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to…
