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This document specifies a method for the measurement of haze, an optical property resulting from wide-angle scattering of light, in transparent and substantially colourless plastics. This method is applicable to the measurement of haze values of less than 40 %. NOTE      The haze of abraded or matted transparent plastics can be measured, but the value obtained can be erroneously lower than the…

This document describes a method for testing the susceptibility to antifungal agents of yeasts, including Candida spp. and Cryptococcus neoformans, that cause infections. The reference method described here has not been used in studies of the yeast forms of dimorphic fungi, such as Blastomyces dermatitidis and/or Histoplasma capsulatum variety capsulatum. Moreover, testing filamentous fungi (…

Le présent document décrit une méthode d’essai de la sensibilité aux agents antifongiques des levures pathogènes, dont Candida spp. et Cryptococcus neoformans. La méthode de référence décrite ici n’a pas été utilisée dans des études sur les phases levures de champignons dimorphes tels que Blastomyces dermatitidis et/ou Histoplasma capsulatum variété capsulatum. En outre, les essais sur les…

This document specifies the tests which can be used for qualification of welding procedure specifications for spot, seam, and projection welding processes. NOTE       The procedures are written for embossed projection welding. They can be adapted for solid projections as well, e.g. nut welding, stud welding. cross wire welding. This document defines the conditions for carrying out tests and the…

Le présent document donne les exigences et les mesures de sécurité relatives aux scies circulaires à panneaux horizontales à presseur dont le chariot porte-scie de la ligne de coupe frontale est monté sous le support de pièce, qui sont chargées manuellement et/ou mécaniquement et déchargées manuellement, capables d’une utilisation en production continue, telles que définies en 3.1 et ci-après…

IEC 60034-9:2021 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 60034-9:2021 edition 5.0 and the previous IEC 60034-9:2003+AMD1:2007 CSV edition 4.1. Futhermore, comments from IEC TC 2 experts are provided to explain the reasons of the most relevant changes. IEC 60034-9:2021…

IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured…

IEC TS 62607-6-19:2021(E) establishes a standardized method to determine the chemical key control characteristic • elemental composition for powder consisting of graphene-based material by • CS analyser and ONH analyser. The method as described in this document determines the content of carbon (C), sulfur (S), oxygen (O), nitrogen (N) and hydrogen (H). The carbon (C) and sulfur (S) content…

IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic • strain uniformity for single-layer graphene by • Raman spectroscopy. The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic…

IEC TS 62607-6-10:2021(E) establishes a standardized method to determine the electrical key control characteristic – sheet resistance (Rs) for films of graphene-based materials by – terahertz time domain spectroscopy (THz-TDS). In this technique, a THz pulse is sent to the graphene-based material. The transmitted or reflected THz waveform is measured in the time domain and transformed to the…